Characterization of crystal growth defects by X-ray methods :
Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] /
edited by Brian K. Tanner and D. Keith Bowen.
- New York, N.Y. : Plenum Press, c1980.
- xxvi, 589 p. : ill. ; 26 cm.
"Published in cooperation with NATO Scientific Affairs Division."
0306406284
Crystals--Defects--Congresses X-ray crystallography--Congresses
548/.5 / BRI
"Published in cooperation with NATO Scientific Affairs Division."
0306406284
Crystals--Defects--Congresses X-ray crystallography--Congresses
548/.5 / BRI