Normal view MARC view ISBD view

Digital circuit testing:

Wang, Francis C.

Digital circuit testing: a guide to DFT and other techniques - San Diego Academic Press 1991 - xi, 233p.

Ref. at the end of each chap.

Universal Decimal Class. No.: 621.3.049.77 / WANG

Print
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)