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Fault - tolerance and reliability techniques for high density random access memories

Chakraborty, Kanad

Fault - tolerance and reliability techniques for high density random access memories - New Delhi Prentice Hall 2002 - 426p.

ISBN: 8120322142

Subjects--Index Terms: Integrated circuits 621.38.049.77

Dewey Class. No.: 621.38.049.77 / CHA

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