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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements

Rupa R. Pai

Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements - - Kochi Department of Physics, CUSAT 2004 - xviii, 182p.

Thesis (Ph.D), CUSAT, 2004

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Subjects--Index Terms: Semiconducting thin films

Dewey Class. No.: 539.216.2

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