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Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale

Kalinin, Sergei

Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale - - New York Springer 2007 - xx, 980p.

ISBN: 9780387286679

ISSN:

Subjects--Index Terms: Scanning probe microscopy Nanoelectronics

Dewey Class. No.: 621.385.833

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