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Defects in microelectronic materials and devices

Fleetwood, Daniel M.

Defects in microelectronic materials and devices - - London CRC 2009 - xvi,753p.

ISBN: 9781420043761

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Subjects--Index Terms: Microelectronics-materials-testing Metal oxide semiconductor field effect transistors-testing Integrated circuits-defects

Dewey Class. No.: 621.3.049.77

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