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In situ characterization of thin film growth

Koster, Gertjan

In situ characterization of thin film growth Gertjan Koster and Guus Rijnders - Cambridge Woodhead Publishing 2011 - xi, 282p. - Woodhead publishing in materials .

ISBN: 9781845699345

Subjects--Index Terms: Thin film growth - Electron diffraction techniques Crystal growth

Universal Decimal Class. No.: 539.216 / KOS

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