Fundamental principles of engineering nanometrology
Leach, Richard K
Fundamental principles of engineering nanometrology - Amsterdam Elsevier 2010 - xxvi, 321p.
9780080964546
Nanometrology Nanotechnology Coordinate metrology
681.2:620.3 / LEA
Fundamental principles of engineering nanometrology - Amsterdam Elsevier 2010 - xxvi, 321p.
9780080964546
Nanometrology Nanotechnology Coordinate metrology
681.2:620.3 / LEA