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Non-destructive evaluation of ion implanted semiconducfor thin films using photothermal deflection spectrosco

Paulraj, M.

Non-destructive evaluation of ion implanted semiconducfor thin films using photothermal deflection spectrosco - Kochi Dept.of Physics - CUSAT 2004 - 256p.

Thesis (Ph.D),CUSAT, 2004

Guide : Vijayakumar, K.P.

Subjects--Index Terms: Optics Photothermal deflection spectroslopy Guide : Vijayakumar, K.P.

Universal Decimal Class. No.: 535.8 / PAU

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