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Multiple beam interferometry of surfaces and films

Tolansky, S

Multiple beam interferometry of surfaces and films - - New York Dover 1970 - vi, 186p., illus.

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Subjects--Index Terms: interference Analysis, spectrum Spectra Spectrochemistry Spectroscopy Mass spectroscopy NMR spectroscopy IR spectroscopy Infrared spectroscopy nmr Optics Astrophysics Chemistry Radiation Light Photometry Optics Colour Optical storage devices Spectrum analysis Phosphoresence Spectroscopy Physics Optical physics

Dewey Class. No.: 535.41

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