Measurement technique for thin films [proceedings] (Record no. 13325)

MARC details
000 -LEADER
fixed length control field 00715nam a2200241 a 4500
001 - CONTROL NUMBER
control field adlib96000001
003 - CONTROL NUMBER IDENTIFIER
control field ViArRB
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20151026130807.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 960221s1955 dcuabcdjdbkoqu001 0deng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER
International Standard Serial Number
040 ## - CATALOGING SOURCE
Original cataloging agency Adlib
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3.049.772.2:621.317
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Schwartz, Bertram
Relator term d. By
245 ## - TITLE STATEMENT
Title Measurement technique for thin films [proceedings]
250 ## - EDITION STATEMENT
Edition statement
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc. New York
Name of publisher, distributor, etc. The Electrochemical Society
Date of publication, distribution, etc. 1967
300 ## - PHYSICAL DESCRIPTION
Extent vi, 364p.
Dimensions
500 ## - GENERAL NOTE
General note Symposium sponsored by Electronics division of the electrochemical society
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Microelectronics
-- Electronics
-- Semiconductors
-- Thin films
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Schwartz, Newton
--
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type
        University Library University Library 06/16/2010   621.3.049.772.2:621.317 SCH 00012845 06/16/2010 06/16/2010 Books

University Library
Cochin University of Science and Technology
Kochi-682 022, Kerala, India