Electron microscopy and microanalysis of metals. (Record no. 149046)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00478cam a2200157u 4500 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20160318124911.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 820521s1968 nyua 000 0 eng |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 669/.95/0282 |
| Item number | BEL |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Belk, J. A. |
| 9 (RLIN) | 8424 |
| 245 10 - TITLE STATEMENT | |
| Title | Electron microscopy and microanalysis of metals. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc. | New York [etc.] |
| Name of publisher, distributor, etc. | Elsevier Pub. Co., |
| Date of publication, distribution, etc. | 1968. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | ix, 255 p. with illus. |
| Dimensions | 23 cm. |
| 653 ## - INDEX TERM--UNCONTROLLED | |
| Uncontrolled term | Electron metallography |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Davies, A. L., |
| 9 (RLIN) | 8423 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Books |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Home library | Current library | Date acquired | Total Checkouts | Full call number | Barcode | Date last seen | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Dewey Decimal Classification | Department of Physics | Department of Physics | 03/03/2010 | 669/.95/0282 BEL | PHY002987 | 03/03/2010 | 03/03/2010 | Books |