Non-destructive evaluation of ion implanted semiconductor thin films using photothermal deflection spectroscopy (Record no. 268275)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00513nam a22001577a 4500 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20220519105810.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 110704t xxu||||| |||| 00| 0 eng d |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | PH. D |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Paulraj, M. |
| 9 (RLIN) | 9035 |
| 245 ## - TITLE STATEMENT | |
| Title | Non-destructive evaluation of ion implanted semiconductor thin films using photothermal deflection spectroscopy |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc. | Cochin: |
| Name of publisher, distributor, etc. | Cochin University of Science and Techonology, |
| Date of publication, distribution, etc. | 2004. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | Ph. D |
| 653 ## - INDEX TERM--UNCONTROLLED | |
| Uncontrolled term | Thin film |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Vijayakumar, K. P (Guide) |
| 9 (RLIN) | 8969 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Reference |
No items available.