X-ray diffraction (Record no. 334267)
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000 -LEADER | |
---|---|
fixed length control field | 00408 a2200157 4500 |
003 - CONTROL NUMBER IDENTIFIER | |
control field | OSt |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 090320t xxu||||| |||| 00| 0 eng d |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 543.442.3 |
Item number | CHA |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 8120312708 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Chatterjee, Sanat kumar |
9 (RLIN) | 4733 |
245 ## - TITLE STATEMENT | |
Title | X-ray diffraction |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
Place of publication, distribution, etc. | New Delhi |
Name of publisher, distributor, etc. | Prentice Hall |
Date of publication, distribution, etc. | 1999 |
300 ## - PHYSICAL DESCRIPTION | |
Extent | ix, 199p. |
653 ## - INDEX TERM--UNCONTROLLED | |
Uncontrolled term | X-ray - diffraction |
-- | 543.442.3 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Reference |
Source of classification or shelving scheme | Dewey Decimal Classification |
Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Home library | Current library | Date acquired | Total Checkouts | Full call number | Barcode | Date last seen | Price effective from | Koha item type |
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Dewey Decimal Classification | School of Engineering | School of Engineering | 03/20/2009 | 543.442.3 CHA | SE7412 | 03/20/2009 | 03/20/2009 | Reference |