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X-ray microscopy : proceedings of the international symposium, Göttingen, Fed. Rep. of Germany, September 14-16, 1983 / editors, G. Schmahl and D. Rudolph.
Material type:
TextSeries: Springer series in optical sciences ; v. 43Publication details: Berlin ; Springer-Verlag, 1984.Description: ix, 345 p. : ill. (some col.) ; 24 cmISBN: - 0387132716
- 502/.8/2 SCH
| Item type | Current library | Call number | Status | Date due | Barcode |
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Department of Physics | 502/.8/2 SCH (Browse shelf(Opens below)) | Available | PHY007614 |
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| 502/.8/2 COR Confocal scanning optical microscopy and related imaging systems / | 502/.8/2 FIL Near field optics and nanoscopy / | 502.8/2 JER Introduction to optical microscopy / | 502/.8/2 SCH X-ray microscopy : | 502/.8/25 CHA.1 Understanding & optimising electron microscope performance / | 502.825 GOL Scanning Electron Microscopy and X-Ray Microanalysis / | 502/.8/25 MUR Electron and ion microscopy and microanalysis : |
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