Field ion microscopy; principles and applications, by Erwin W. Müller and Tien Tzou Tsong.
Material type: TextPublication details: New York, American Elsevier Pub. Co., 1969.Description: ix, 314 p. illus. (part col.) 24 cmISBN:- 0444000623
- 578/.1 MUL
Item type | Current library | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
Books | Department of Physics | 578/.1 MUL (Browse shelf(Opens below)) | Available | PHY002966 |
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