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Advances in x-ray diffractometry and x-ray spectrography: a volume of fifteen selected reprints from philips laboratories Irvington-on Hudson, New York, USA

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TextPublication details: Eindhoven Centrex Publishing Cp. 1962Subject(s):

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	Department of Physics	548.83 PAR (Browse shelf(Opens below))	Available		PHY001193

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Previous	548/.83 KLU X-ray diffraction procedures for polycrystalline and amorphous materials	548.83 KON Ionization x-ray equipment for research on crystalline materials at various temperatures	548/.83 LON.3 International tables for X-ray crystallography,	548.83 PAR Advances in x-ray diffractometry and x-ray spectrography:	548.83 SUR X-ray diffraction: a practical approach	548.83 SUR;1 X-ray diffraction: a practical approach	548/.83 TAN* X-ray diffraction topography /	Next

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