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Diffraction and imaging techniques in material science / editors, S. Amelinckx, R. Gevers, J. Van Landuyt. 2v.; v1. electron microscopy, v2. imaging and diffraction techniques
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TextPublication details: Amsterdam ; North-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland, 1978.Edition: 2d, rev. edDescription: 2 v. (xvii, 847 p., [1] fold. leaf of plates) : ill. ; 23 cmISBN: - 0444851305
- 620.1/127 AME
| Item type | Current library | Call number | Status | Date due | Barcode |
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Department of Physics | 620.1/127 AME.1 (Browse shelf(Opens below)) | Available | PHY006190 | |
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Department of Physics | 620.1/127 AME.2 (Browse shelf(Opens below)) | Available | PHY006191 |
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| 620.1/1232 SCH Elastic constants and their measurement | 620.1/126 HER Statistical models for the fracture of disordered media / | 620.1/126 WEE Dislocation based fracture mechanics / | 620.1/127 AME.1 Diffraction and imaging techniques in material science / | 620.1/127 AME.2 Diffraction and imaging techniques in material science / | 620.1/127 BLI Electrical and magnetic methods of non-destructive testing / | 620.1/127 BLI;1 Electrical and magnetic methods of non-destructive testing / |
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