Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
Material type: TextPublication details: Cochin: Cochin University of Science and Technology, 2004.Description: Ph. DSubject(s): DDC classification:- PH. D
Item type | Current library | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
Reference | Department of Physics | PH. D (Browse shelf(Opens below)) | Not for loan | PHYD/0089 |
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