Non-destructive evaluation of ion implanted semiconductor thin films using photothermal deflection spectroscopy

By: Contributor(s): Material type: TextTextPublication details: Cochin: Cochin University of Science and Techonology, 2004.Description: Ph. DSubject(s): DDC classification:
  • PH. D
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Item type Current library Call number Status Date due Barcode
Reference Reference Department of Physics PH. D (Browse shelf(Opens below)) Not for loan PHYD/0093

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