Software reliability : measurement, prediction, application / John D. Musa, Anthony Iannino, Kazuhira Okumoto.
Material type: TextPublication details: New York : McGraw-Hill, c1987.Description: xvii, 621 p. : illSubject(s):Item type | Current library | Call number | Copy number | Status | Date due | Barcode |
---|---|---|---|---|---|---|
Books | Department of Mathematics | 681.3.06 MUR (Browse shelf(Opens below)) | 1 | Available | MAT03944 |
Includes indexes.
There are no comments on this title.