Software reliability : measurement, prediction, application / John D. Musa, Anthony Iannino, Kazuhira Okumoto.

By: Contributor(s): Material type: TextTextPublication details: New York : McGraw-Hill, c1987.Description: xvii, 621 p. : illSubject(s):
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Books Books Department of Mathematics 681.3.06 MUR (Browse shelf(Opens below)) 1 Available MAT03944

Includes indexes.

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