Defects control in semiconductors : proceedings of the conference on the science and technology of defect control in semiconductors, The Yokohama 21st century forum, Yokohama, Japan, Sept. 17-22: 1989
Material type: TextSeries: ; v.1Publication details: Amsterdam North-Holland 1990 ISBN:- 0-444-88429-7
Item type | Current library | Call number | Status | Date due | Barcode |
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Reference | University Library | 621.382:620.1 SUM (Browse shelf(Opens below)) | Not for loan | 00041235 |
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621.382:547.1:535.14(035) NAL.2 Handbook of organic electronics and photonics | 621.382:547.1:535.14(035) NAL.3 Handbook of organic electronics and photonics | 621.382:606 BAD Biomems | 621.382:620.1 SUM Defects control in semiconductors : | 621.382:620.1 SUM.2 Defects control in semiconductors: Proceedings of the conference on the science and technology of defect control in semiconductors,... | 621.382:620.3 JHA MEMS and nanotechnology-based sensors and devices for communications, medical and aerospace applications | 621.382:620.3 LYS Nano and micro electomechanical systems: fundamentals of nano and microengineering |
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