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Semiconductor Memories Technology, Testing, and Reliability

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Material type: Text

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TextPublication details: New Delhi Prentice Hall of India Pvt LtdDescription: 462pISBN:

9788120316836

Subject(s):

Random Access Memory Technologies, Nonvolatile Memories, Memory Fault Modeling and Testing, Memory Design for Testability and fault Tolerance, Semiconductor Memory Reilability

DDC classification:

621.39732

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