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X-ray microscopy : proceedings of the international symposium, Göttingen, Fed. Rep. of Germany, September 14-16, 1983 / editors, G. Schmahl and D. Rudolph.

Contributor(s): Material type: TextTextSeries: Springer series in optical sciences ; v. 43Publication details: Berlin ; Springer-Verlag, 1984.Description: ix, 345 p. : ill. (some col.) ; 24 cmISBN:
  • 0387132716
Subject(s): DDC classification:
  • 502/.8/2 SCH
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