X-ray optics and X-ray microanalysis. Edited by H.H. Pattee, V.E. Cosslett [and] Arne Engström.

By: Contributor(s): Material type: TextTextPublication details: New York, Academic Press, 1963.Description: xvii, 622 p. illus. 24 cmSubject(s): DDC classification:
  • 537.5352 PAT
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