Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 / edited by J. Donecker and I. Rechneberg.

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TextSeries: Institute of physics series ; no. 160Publication details: Bristol ; Institute of Physics Pub., 1998.Description: xx, 524 p. : ill. ; 24 cmISBN:

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