Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] / edited by Brian K. Tanner and D. Keith Bowen.

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TextPublication details: New York, N.Y. : Plenum Press, c1980.Description: xxvi, 589 p. : ill. ; 26 cmISBN:

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"Published in cooperation with NATO Scientific Affairs Division."

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