Characterization of CdS based multilayer thin films useful for photovoltaic device fabrication using different techniques with emphasis on ellipsometry

By: Contributor(s): Material type: TextTextPublication details: Cochin: Cochin University of Science and Techonology, 1994.Description: Ph. DSubject(s): DDC classification:
  • PH. D
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Cochin University of Science and Technology
Kochi-682 022, Kerala, India