Random data analysis and measurement procedures
Publication details: New York Wiley interscienceSubject(s): DDC classification:- 681.3.01 BEN
| Item type | Current library | Call number | Status | Date due | Barcode |
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School of Engineering | 681.3.01 BEN (Browse shelf(Opens below)) | Not for loan | SEG93 |
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| 681.3.006 SIM Embedded software primer | 681.3.006 SIM Embedded software primer | 681.3.006 SIM Embedded software primer | 681.3.01 BEN Random data analysis and measurement procedures | 681.3.01 BEN Random data: Analysis and Measurement Procedures | 681.3.01 ROT Fundamentals of logic design | 681.3.01 ROT Fundamentals of logic design |
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