Amazon cover image
Image from Amazon.com

Fault-tolerance and reliability techniques for high-density random-access memories

By: Contributor(s): Material type: TextTextPublication details: New Delhi Pearson Education 2002Description: xix,426pISBN:
  • 81-7808-769-3
Subject(s):
Tags from this library: No tags from this library for this title.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Call number Status Date due Barcode
Books Books University Library 004.332.3 CHA (Browse shelf(Opens below)) Available 00050054

There are no comments on this title.

to post a comment.

University Library
Cochin University of Science and Technology
Kochi-682 022, Kerala, India