System-on-chip test architectures: nanometer design for testability
Material type: TextPublication details: Boston Morgan Kaufmann 2008Edition: Description: xxxiii, 856pISBN:- 9780123739735
- 621.9
Item type | Current library | Call number | Status | Date due | Barcode |
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Books | University Library | 621.9 WAN (Browse shelf(Opens below)) | Available | 00059065 |
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