Reliability of MEMS:testing of materials and devices

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TextPublication details: Weinheim Wiley-VCH Verlag GmbH & Co. KGaA 2008Edition: Description: xx,303pISBN:

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Item type	Current library	Call number	Status	Date due	Barcode
Books	University Library	621.382 TAB (Browse shelf(Opens below))	Available		00061906

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Previous	621.382 SUR Power electronics	621.382 SZE;1 Physics of semiconductor devices	621.382 SZE;1 Physics of Semiconductor devices	621.382 TAB Reliability of MEMS:testing of materials and devices	621.382 TOC Digital systems: principles and applications	621.382 TRZ Introduction to modern power electronics	621.382 TUR ABC's of varactors	Next

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