Fringe pattern analysis for optical metrology theory, algorithms and applications Manuel Servin, J Antonio Quiroga and J Moises Padilla

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Publication details: 2014 Wiley-VCH GermanyDescription: xvi, 327pISBN:

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Item type	Current library	Call number	Status	Date due	Barcode
Books	University Library	535.241 SER (Browse shelf(Opens below))	Available		00072086

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Previous	535.215:771.53 NAL Supramolecular photosensitive and electroactive materials	535.21:616-089.891.1 AME Evaluation of radiation exposure levels in cine caddiac catheterization laboratories	535.232.1 HOW Principles of random signals analysis and low noise design: the power spectral density and its application	535.241 SER Fringe pattern analysis for optical metrology	535.241 WIL Introduction to the optical transfer function	535.243.3 CAS Optical data processing:applications	535.243.3 SHU Optical data processing	Next

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