Physical aspects of electron microscopy and microbeam analysis Jointly sponsored by Electron Microscopy Society of America and the Microbeam Analysis Society
Material type: TextPublication details: New york John wiley 1975Subject(s): DDC classification:- 578.45 l5
Item type | Current library | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
Books | School of Marine Sciences Book Cart | 578.45 L5 (Browse shelf(Opens below)) | Available | MS002879 |
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