Quality beyond six sigma / Ron Basu, J. Nevan Wright

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Material type: Text

TextPublication details: New York: Butterworth Heinemann 2003Description: x, 188pISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	Department of Computer Application	658.56:519 248 BAS (Browse shelf(Opens below))	Available		CA003737

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