Schwartz, Bertram <br/><br/>
Measurement technique for thin films [proceedings] 

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 - New York  The Electrochemical Society  1967 
 - vi, 364p.   
<br/><br/>  Symposium sponsored by Electronics division of the electrochemical society 
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<br/><br/><label>Subjects--Index Terms: </label>Microelectronics  Electronics  Semiconductors  Thin films 
<br/><br/><label>Dewey Class. No.: </label>621.3.049.772.2:621.317