TY  - BOOK
AU  - Schwartz, Bertram
AU  - Schwartz, Newton
TI  - Measurement technique for thin films [proceedings]
U1  - 621.3.049.772.2:621.317 
PY  - 1967///
CY  - New York
PB  - The Electrochemical Society
KW  - Microelectronics
KW  - Electronics
KW  - Semiconductors
KW  - Thin films
N1  -  Symposium sponsored by Electronics division of the electrochemical society
ER  -