X-ray microscopy :  proceedings of the international symposium, Göttingen, Fed. Rep. of Germany, September 14-16, 1983 / 
editors, G. Schmahl and D. Rudolph. 
 - Berlin ;  Springer-Verlag,  1984. 
 - ix, 345 p. :  ill. (some col.) ;  24 cm. 
 - Springer series in optical sciences;   v. 43 .
<br/><br/><label>ISBN: </label>0387132716  
<br/><br/><label>Subjects--Index Terms: </label>X-ray microscopy--Congresses 
<br/><br/><label>Dewey Class. No.: </label>502/.8/2  / SCH