Ion spectroscopies for surface analysis / 
edited by A.W. Czanderna and David M. Hercules. 
 - New York :  Plenum Press,  c1991. 
 - xvii, 469 p. :  ill. ;  24 cm. 
 - Methods of surface characterization;  v. 2 .
<br/><br/><label>ISBN: </label>0306437929 
<br/><br/><label>Subjects--Index Terms: </label>Solids--Surfaces--Analysis  Secondary ion mass spectrometry  Surface chemistry 
<br/><br/><label>Dewey Class. No.: </label>541.3/3  / CZA