Murr, Lawrence Eugene. <br/><br/>
Electron and ion microscopy and microanalysis :  principles and applications / 
Lawrence E. Murr. 
 - New York :  Marcel Dekker,  c1982. 
 - xiv, 793 p. :  ill. ;  27 cm. 
 - Optical engineering ;  v. 1 .
 - Optical engineering (Marcel Dekker, Inc.) ;  v. 1. .
<br/><br/><label>ISBN: </label>0824715535 
<br/><br/><label>Subjects--Index Terms: </label>Electron microscopy  Field ion microscopy  Microprobe analysis 
<br/><br/><label>Dewey Class. No.: </label>502/.8/25  / MUR