TY  - BOOK
AU  - Amelinckx,S.,ed
AU  - Gevers,R.,ed
AU  - Landuyt,J.van,ed
TI  - Diffraction and imaging techniques in material science: 2v.; v1. electron microscopy,  v2. imaging and diffraction techniques
SN  - 0444851305
U1  - 620.1/127 
PY  - 1978///
CY  - Amsterdam
PB  - North-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland
KW  - Electron microscopy--Congresses
KW  - Electrons--Diffraction--Congresses
KW  - Imaging systems--Congresses
ER  -