Characterization of crystal growth defects by X-ray methods :  [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] / 
edited by Brian K. Tanner and D. Keith Bowen. 
 - New York, N.Y. :  Plenum Press,  c1980. 
 - xxvi, 589 p. :  ill. ;  26 cm. 
<br/><br/> "Published in cooperation with NATO Scientific Affairs Division." 
<br/><br/><label>ISBN: </label>0306406284 
<br/><br/><label>Subjects--Index Terms: </label>Crystals--Defects--Congresses  X-ray crystallography--Congresses 
<br/><br/><label>Dewey Class. No.: </label>548/.5  / BRI