TY  - BOOK
AU  - Paulraj, M.
AU  - Vijayakumar, K. P (Guide)
TI  - Non-destructive evaluation of ion implanted semiconductor thin films using photothermal deflection spectroscopy
U1  - PH. D 
PY  - 2004///
CY  - Cochin
PB  - Cochin University of Science and Techonology
KW  - Thin film
ER  -