TY  - BOOK
AU  - Tandon, U. S.
AU  - Khokle, W. S.
TI  -  Pattering of material layers in submicron region
SN  - 81-224-0561-4
U1  - 621.38 
PY  - 1993///
CY  - New Delhi
PB  - Wiley Eastern
KW  - ElectronicsElectronicsAmplifiers- electronicsCyberneticsdigital electronicsElectric conductors
N1  - International School of Photonics
ER  -