Sirohi,Rajpal.S <br/><br/>
Speckle metrology 

 - Newyork  Marcek Dekker  1993 
 - 551p  Optical engineering;38 
<br/><br/><label>ISBN: </label>0824789326 
<br/><br/><label>Dewey Class. No.: </label>620.112 7  / SIR