Sharma, K Ashok <br/><br/>
Semiconductor Memories  Technology, Testing, and Reliability 

 - New Delhi  Prentice Hall of India Pvt Ltd 
 - 462p. 
<br/><br/><label>ISBN: </label>9788120316836 
<br/><br/><label>Subjects--Index Terms: </label>Random Access Memory Technologies, Nonvolatile Memories, Memory Fault Modeling and Testing, Memory Design for Testability and fault Tolerance, Semiconductor Memory Reilability 
<br/><br/><label>Dewey Class. No.: </label>621.39732