TY  - BOOK
AU  - Sharma, K Ashok
ED  - IEEE Press
TI  - Semiconductor Memories: Technology, Testing, and Reliability
SN  - 9788120316836
U1  - 621.39732 
CY  - New Delhi
PB  - Prentice Hall of India Pvt Ltd
KW  - Random Access Memory Technologies, Nonvolatile Memories, Memory Fault Modeling and Testing, Memory Design for Testability and fault Tolerance, Semiconductor Memory Reilability
ER  -