Nicollian, E H <br/><br/>
MOS(Metal Oxide Semiconductor)  Physics and Technology 

 - New Jersey  John Wiley & Sons Inc 
 - 906p. 
<br/><br/> Wiley Classics Library Edition Published 2003 
<br/><br/><label>ISBN: </label>9780471430797 
<br/><br/><label>Subjects--Index Terms: </label>Interfacial Nonuniformities, Extraction of Interface Trap Properties, Field Effect 
<br/><br/><label>Dewey Class. No.: </label>621.38152