TY  - BOOK
AU  - Nicollian, E H
AU  - Brews, J R
TI  - MOS(Metal Oxide Semiconductor): Physics and Technology
SN  - 9780471430797
U1  - 621.38152 
CY  - New Jersey
PB  - John Wiley & Sons Inc
KW  - Interfacial Nonuniformities, Extraction of Interface Trap Properties, Field Effect
N1  - Wiley Classics Library Edition Published 2003
ER  -