TY  - SER
AU  - Mueller, William M., ed.
ED  - Conference on Application of X-ray Analysis.
ED  - Denver Research Institute.
TI  - Advances in x-ray analysis: v 1 - proceedings of the ... annual C of X-ray Analysis  held  August7-9, 1957.
SN  - 0376-0308
U1  - 539.7/222 
PY  - 1960///-c1997
CY  - New York
PB  - Plenum Press
KW  - X-rays--Industrial applications--Congresses
KW  - Radiometry--Congresses
KW  - Kristallografie
KW  - Röntgenstraling
ER  -